A silicon detector for the Stereoscan scanning electron microscope
Authors:
- A B MundenAMA B Munden
- D E Y WalkerDWD E Y Walker
- 1 September 1973
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 6 (9) , 916-920
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- ELECTRON BEAM CHANNELING IN SINGLE-CRYSTAL SILICON BY SCANNING ELECTRON MICROSCOPYApplied Physics Letters, 1969
- Application à la métallographie des méthodes interférentielles à deux ondes polariséesRevue de Métallurgie, 1955