Experiment and theoretical prediction for subsurface microcracks and damage depth of multi-crystalline silicon wafer in diamond wire sawing

Authors:
  • XLXinying Li
    Xinying Li
  • YGYufei Gao
    Yufei Gao
  • RLRuntao Liu
    Runtao Liu
  • WZWei Zhou
    Wei Zhou

Abstract
No abstract available
Funding Information
  • Key Technology Research and Development Program of Shandong Province (2020CXGC011003)
  • National Natural Science Foundation of China (51875322)

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