Open-Transistor Fault Diagnostics in Voltage-Source Inverters by Analyzing the Load Currents
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- 5 June 2009
- journal article
- research article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Industrial Electronics
- Vol. 56 (11) , 4681-4688
Abstract
A novel method is presented for the detection and isolation of open-transistor faults in voltage-source inverters feeding AC motors. The method is an extension of the normalized DC-components method. The normalized average currents are combined with additional diagnostic variables which convey information about the percentage of time spent by the phase currents in the near-zero zone. The combined diagnostic signals permit much more robust diagnostics of single-transistor faults and make feasible the diagnostics of multiple-transistor faults. Suggested in this paper is also an alternative solution for the normalization of DC components, which is easier interpreted and simpler to implement.Keywords
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