EPI-guided adaptive refocusing for high-SNR 3D measurement in a large-DOF MEMS-based structured light field
Authors:
- 18 March 2026
- journal article
- Published by Optica Publishing Group in Optics Express
- Vol. 34 (6) , 11225
Abstract
Structured light field (SLF) 3D measurement integrating micro-electro-mechanical system (MEMS) projection with unfocused plenoptic cameras (UPC) offers a promising solution for large depth of field (DOF) metrology. However, the high coherence of laser illumination and small UPC sub-apertures generates severe speckle and low signal-to-noise ratio (SNR), degrading reconstruction accuracy. To alleviate these issues, this paper proposes an EPI-guided adaptive refocusing model (EGARM). The model employs a phase-encoded epipolar plane image (EPI) analysis to extract phase features and adaptively estimate a depth-related slope factor. This factor subsequently guides digital refocusing to aggregate multiple sub-aperture views from the 4D light field. By averaging speckle patterns across viewpoints, the method synthesizes sharp images while effectively suppressing speckle. Additionally, a refocused ray calibration and global geometric refinement framework is introduced to impose global geometric constraints and help limit the degradation of reconstruction accuracy across the measurement volume. Experimental results demonstrate stable 3D reconstruction over an extended depth range of approximately 400-1856 mm, during which the effective field of view (FOV) expands from 120 mm × 200 mm to 580 mm × 780 mm, with reconstruction accuracy consistently better than 0.45 mm.Keywords
Funding Information
- National Key Research and Development Program of China (2023YFF0716900)
- National Natural Science Foundation of China (62275173)
- National Natural Science Foundation of China (62371311)
- Scientific Instrument Developing Project of Shenzhen University (2023YQ009)
- Shenzhen University Research Team Cultivation Project (2023JCT003)
This publication has 32 references indexed in Scilit:
- Extended depth-of-field digital fringe projection for additive manufacturing process monitoringOptics and Lasers in Engineering, 2025
- Defocus compensation in large-depth-of-field FPP system based on parallel single-pixel imagingOptics & Laser Technology, 2025
- Single-shot super-resolved fringe projection profilometry (SSSR-FPP): 100,000 frames-per-second 3D imaging with deep learningLight: Science & Applications, 2025
- Generalized Multi-Feature-Guided Progressive Fringe Order Correction for Fringe Projection ProfilometryIEEE Transactions on Image Processing, 2025
- Modeling window smoothing effect hidden in fringe projection profilometryMeasurement, 2024
- Large depth range binary-focusing projection 3D shape reconstruction via unpaired data learningOptics and Lasers in Engineering, 2024
- Single-pixel imaging-based PSF compensation for large depth-of-field fringe projection profilometryMeasurement, 2024
- Accurate defocusing fringe projection profilometry in a large depth-of-fieldOptics & Laser Technology, 2023
- A novel projector ray-model for 3D measurement in fringe projection profilometryOptics and Lasers in Engineering, 2022
- 3-D shape measurement based on complementary Gray-code lightOptics and Lasers in Engineering, 2012