Automatic deconvolution of 4Pi-microscopy data with arbitrary phase
- 13 November 2009
- journal article
- Published by Optica Publishing Group in Optics Letters
- Vol. 34 (22) , 3583-3585
Abstract
We propose a maximum a posteriori-based method that solves an important practical problem in the deconvolution of 4Pi images by simultaneously delivering an estimate of both the object and the unknown phase. The method was tested in simulations and on data from both test samples and biological specimen. It generates object estimates that are free from interference artifacts and reliably recovers arbitrary relative phases. Based on vectorial focusing theory, our theoretical analysis allowed for a simple and efficient implementation of the algorithm. Taking several 4Pi images at different relative phases of the interfering beams is shown to improve the robustness of the approach.Keywords
Funding Information
- German Federal Ministry of Education and Research
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