Diffraction Pattern and Structure of Noncrystalline BeF2 and SiO2 at 25°C
Author:
- 1 March 1972
- journal article
- Published by AIP Publishing in The Journal of Chemical Physics
- Vol. 56 (5) , 1905-1909
Abstract
The scattering of x rays from noncrystalline samples of BeF2 and SiO2 at 25°C has been measured and analyzed. The diffraction patterns, typical of the atomic arrangement found in liquids, show interference to values of the scattering variable s=16 and beyond. The glasses contain BeF4 (SiO4) tetrahedra joined at the corners so that one anion is common to two tetrahedra. The packing of these tetrahedra is very similar to that found in the crystalline modifications of BeF2 and SiO2, and a model based on the quartz structure describes the diffraction data quantitatively.Keywords
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