Concerning the semimetallic characters of TiS2 and TiSe2

Author:

JWJohn A. Wilson
John A. Wilson

Publisher website

1 June 1977

journal article
Published by Elsevier in Solid State Communications

Vol. 22 (9) , 551-553
DOI:10.1016/0038-1098(77)90133-8

Abstract

No abstract available

This publication has 19 references indexed in Scilit:

Electron-Hole Scattering and the Electrical Resistivity of the Semimetal ${TiS}_{2}$
Physical Review Letters, 1976
Angle-Resolved Photoemission from Ti ${Se}_{2}$ Using Synchrotron Radiation
Physical Review Letters, 1976
Physical properties of Ti $S_{2}$ thin films
Physical Review B, 1976
Electron-Electron Scattering in Ti $S_{2}$
Physical Review Letters, 1975
The self-consistent electronic spectrum of the layer crystal TiS₂
Journal of Physics C: Solid State Physics, 1975
The verification of the existence of TiS2
Materials Research Bulletin, 1975
Electronic structure and optical properties of layered dichalcogenides: Ti $S_{2}$ and Ti ${Se}_{2}$
Physical Review B, 1974
Electric and Magnetic Properties of Non-stoichiometric TiS2 Phase
Journal of the Japan Institute of Metals and Materials, 1970
Characteristics of Nonstoichiometry and Iattice Defects of the TiS2 Phase
Journal of the Japan Institute of Metals and Materials, 1970
Statistico Thermodynamical Studies on Equilibrium S2 Pressure for Non-stoichiometric TiS2 Phase
Journal of the Japan Institute of Metals and Materials, 1970