Comments on "Design issues in CMOS differential LC oscillators" [and reply]

Authors:

AHA. Hajimiri
A. Hajimiri
TLT.H. Lee
T.H. Lee

1 February 2000

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits

Vol. 35 (2) , 286-287
DOI:10.1109/4.823455

Abstract

For the original paper see ibid., vol. 34, no. 5, p. 717-24 (1999). The commenter points out that the phase noise difference reported in the aforementioned paper appears to have a topological cause, and he presents a simple analysis to show that the difference is 6 dB under otherwise identical conditions. In reply, the authors clarify some points in their original work.

Keywords

OSCILLATORS
PHASE NOISE
VOLTAGE
NOISE REDUCTION
NOISE LEVEL
TAIL
EQUIVALENT CIRCUITS
CIRCUIT TOPOLOGY
MOS DEVICES
SOLID STATE CIRCUITS

This publication has 2 references indexed in Scilit:

Reduction of the 1/f noise induced phase noise in a CMOS ring oscillator by increasing the amplitude of oscillation
1998
1/ f noise reduction of metal-oxide-semiconductor transistors by cycling from inversion to accumulation
Applied Physics Letters, 1991