Negative Permittivity in (V₂O₅)_100-xSe_x Alloys

This publication has 26 references indexed in Scilit:

• Vanadyl Precursors Used to Modify the Properties of Vanadium Oxide Thin Films Obtained by Chemical Vapor Deposition
  Journal of the Electrochemical Society, 1999
• Proton mobility calculations in the presence of negative capacitances
  Europhysics Letters, 1998
• V 2 O 5 Xerogel Films as Intercalation Hosts for Lithium: I . Insertion Stoichiometry, Site Concentration, and Specific Energy
  Journal of the Electrochemical Society, 1995
• Phase transitions in the multilayer model of a charged interface and the problem of negative capacities
  Electrochimica Acta, 1992
• Characterization of epitaxially grown films of vanadium oxides
  Journal of Applied Physics, 1991
• Formation and characterization of thin film vanadium oxides: Auger electron spectroscopy, X-ray photoelectron spectroscopy, X-ray diffraction, scanning electron microscopy, and optical reflectance studies
  Thin Solid Films, 1991
• Experimental study of microwave reflection gain of AlAs/GaAs/AlAs quantum well structures
  Electronics Letters, 1990
• Negative capacitance in thin film Al-V2O5-Al devices
  Physica Status Solidi (a), 1987
• Ionization Model for Negative Capacitance in Low-Mobility Semiconductors such as Amorphous Chalcogenides
  Journal of Applied Physics, 1971
• The Hole Mobility in Selenium
  Proceedings of the Physical Society (1958-1967), 1960