Structural, magnetic and impedance spectroscopy properties of Ho3+ modified BiFeO3 multiferroic thin film
- 5 January 2019
- journal article
- research article
- Published by Springer Nature in Journal of Materials Science: Materials in Electronics
- Vol. 30 (3) , 2942-2952
Abstract
No abstract availableKeywords
Funding Information
- The National Natural Science Foundation of China (No. 51441006, No. 51608226)
- Development of Science and Technology of Jilin Province (No. 20150204085GX)
- The Thirteenth Five-Year Program for Science and Technology of Education Department of Jilin Province (JJKH20180769KJ)
This publication has 40 references indexed in Scilit:
- Sm–Ti co-substituted BiFeO3 thin films prepared by sol–gel techniqueCurrent Applied Physics, 2011
- Structural, optical and electromagnetic properties of Bi1−xHoxFeO3 multiferroic materialsJournal of Alloys and Compounds, 2011
- Effect of Ba doping on magnetic and dielectric properties of nanocrystalline BiFeO3 at room temperatureJournal of Alloys and Compounds, 2010
- Sr induced modification of structural, optical and magnetic properties in Bi1−xSrxFeO3 (x = 0, 0.01, 0.03, 0.05 and 0.07) multiferroic nanoparticlesSolid State Sciences, 2010
- Effect of niobium dopant on fatigue characteristics of BiFeO3 thin films grown on Pt electrodesJournal of Alloys and Compounds, 2009
- Impedance spectroscopy of multiferroic layered thin filmsPhysical Review B, 2008
- phase andmetal-insulator transition in multiferroicPhysical Review B, 2008
- Multiferroic and magnetoelectric materialsNature, 2006
- Polarized Raman scattering of multiferroicthin films with pseudo-tetragonal symmetryPhysical Review B, 2005
- Dielectric relaxation in solidsJournal of Physics D: Applied Physics, 1999