Conducting probe atomic force microscopy applied to organic conducting blends

This publication has 16 references indexed in Scilit:

• Gate Voltage Dependent Resistance of a Single Organic Semiconductor Grain Boundary
  The Journal of Physical Chemistry B, 2001
• Mesostructure of polymer/carbon black composites observed by conductive probe atomic force microscopy
  Carbon, 2001
• Potentiometry of an operating organic semiconductor field-effect transistor
  Applied Physics Letters, 2001
• Transport and Mechanical Properties of Polyaniline—Poly(methyl methacrylate) Blends Exhibiting Low Percolation Threshold
  Molecular Crystals and Liquid Crystals, 2000
• First AFM observation of thin cermet films close to the percolation threshold using a conducting tip
  Physica B: Condensed Matter, 2000
• Probing electron conduction at the microscopic level in percolating nanocomposites by conducting atomic-force microscopy
  Physical Review B, 1998
• Probing Electrical Transport in Nanomaterials: Conductivity of Individual Carbon Nanotubes
  Science, 1996
• Direct Imaging of the Percolation Network in a Three-Dimensional Disordered Conductor-Insulator Composite
  Physical Review Letters, 1995
• Morphology of conductive, solution-processed blends of polyaniline and poly(methyl methacrylate)
  Synthetic Metals, 1993
• Scanning Tunneling Spectroscopic Evidence for Granular Metallic Conductivity in Conducting Polymeric Polyaniline
  Science, 1992