Fabrication and optical properties of Er-doped multilayers Si-rich SiO2/SiO2: size control, optimum Er–Si coupling and interaction distance monitoring
Authors:
- F. GourbilleauFGF. Gourbilleau
- R. MadelonRMR. Madelon
- C. DufourCDC. Dufour
- R. RizkRRR. Rizk
- 1 February 2005
- journal article
- Published by Elsevier in Optical Materials
- Vol. 27 (5) , 868-875
Abstract
No abstract availableKeywords
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