Angle-resolved XPS measurements on copper phthalocyanine thin films
Authors:
- Barbara AdolphiBABarbara Adolphi
- Olena BergerOBOlena Berger
- Wolf-Joachim FischerWFWolf-Joachim Fischer
- 1 July 2001
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 179 (1-4) , 102-108
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
- Studies on phase transformations of Cu-phthalocyanine thin filmsJournal of Materials Science: Materials in Electronics, 2000
- Characterization of gas-sensitive lead phthalocyanine film surfaces by X-ray photoelectron spectroscopySensors and Actuators B: Chemical, 1990
- Lead phthalocyanine (PbPc) as a prototype organic material for gas sensors: comparative electrical and spectroscopic studies to optimize O2 and NO2 sensingSensors and Actuators, 1989
- X‐Ray Photoelectron Valence Band Studies on Phthalocyanine CompoundsPhysica Status Solidi (b), 1976
- X-ray photoelectron spectroscopy of tetraphenylporphin and phthalocyanineThe Journal of Chemical Physics, 1974
- The ESCA Spectra of Benzene and the Iso-electronic Series, Thiophene, Pyrrole and FuranPhysica Scripta, 1971
- Spectroscopic characterization of a new polymorph of metal-free phthalocyanineThe Journal of Physical Chemistry, 1968
- Zur Elektronenstruktur anionischer Phthalocyaninkomplexe einiger 3d‐ElementeZeitschrift für Chemie, 1966