Microwave Measurement of Mobility: Analysis of Apparatus

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Abstract
The microwave mobility in a semiconductor can be obtained by mounting a sample in a bimodal cavity with an applied static magnetic field and then measuring the power transfer which is produced by the Faraday rotation in the sample. This paper gives an analysis of the effect based on the field distributions in the cavity and the wave propagation in the sample. The dependence of the power transfer on the static applied magnetic field, on the mobility and conductivity of the sample, and on an effective sample size is obtained.