Accurate Estimates of 3D Ising Critical Exponents Using the Coherent-Anomaly Method
Authors:
- M. KolesikMKM. Kolesik
- M. SuzukiMSM. Suzuki
Preprint
Abstract
An analysis of the critical behavior of the three-dimensional Ising model using the coherent-anomaly method (CAM) is presented. Various sources of errors in CAM estimates of critical exponents are discussed, and an improved scheme for the CAM data analysis is tested. Using a set of mean-field type approximations based on the variational series expansion approach, accuracy comparable to the most precise conventional methods has been achieved. Our results for the critical exponents are given by $\alpha=\afin$, $\beta=\bfin$, $\gamma=\gfin$ and $\delta=\dfin$.
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This publication has 1 reference indexed in Scilit:
- Comment to Articles by Masatsugu Suzuki and Sei-ichi Tanuma (J. Phys. Soc. Jpn. 44 (1978) 1539 and 45 (1978) 1645) on the Static Skin Effect in BismuthJournal of the Physical Society of Japan, 1981