Resonance ultrasonic vibrations for crack detection in photovoltaic silicon wafers
Authors:
- W DallasWDW Dallas
- O PolupanOPO Polupan
- S OstapenkoSOS Ostapenko
- 5 February 2007
- journal article
- Published by IOP Publishing in Measurement Science and Technology
- Vol. 18 (3) , 852-858
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Photoluminescence imaging of silicon wafersApplied Physics Letters, 2006
- Crack detection and analyses using resonance ultrasonic vibrations in full-size crystalline silicon wafersApplied Physics Letters, 2006
- Resonance ultrasonic vibration diagnostics of elastic stress in full-size silicon wafersSemiconductor Science and Technology, 2006
- Photographic surveying of minority carrier diffusion length in polycrystalline silicon solar cells by electroluminescenceApplied Physics Letters, 2005