Spectral Analysis of Deep Level Transient Spectroscopy (SADLTS) of Deep Centers in CdTe Single Crystals

Authors:
  • JMJun Morimoto
    Jun Morimoto
  • MFMichihiro Fudamoto
    Michihiro Fudamoto
  • STShuuji Tashiro
    Shuuji Tashiro
  • MAMasaaki Arai
    Masaaki Arai
  • TMToru Miyakawa
    Toru Miyakawa
  • RBRichard H. Bube
    Richard H. Bube
Publisher website
Google Scholar
Abstract
Deep levels in p-type CdTe were studied by SADLTS (spectral analysis deep level transient spectroscopy). Three levels, labeled as A(0.57 eV), B(0.20 eV) and C(0.10 ev) were found. The B and C levels which have, so far, been considered as a single level, have been resolved into two closely spaced levels in our method. Moreover, these two levels were found to have emission rate spectra with finite widths rather than discrete ones. The analysis of the emission rate spectrum indicates that there is a finite distribution in the capture cross section of deep levels.

This publication has 20 references indexed in Scilit: