Backside laser testing of ICs for SET sensitivity evaluation
Authors:
- V. PougetVPV. Pouget
- F. BeaudoinFBF. Beaudoin
- P. PerduPPP. Perdu
- H. LapuyadeHLH. Lapuyade
- P. FouillatPFP. Fouillat
- A. TouboulATA. Touboul
- 1 December 2001
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 48 (6) , 2193-2201
Abstract
A new experimental approach combining backside laser testing and analog mapping is presented. A new technique for integrated circuits (ICs) backside preparation by laser ablation is evaluated. The methodology is applied to the study of single-event transient (SET) sensitivity on a linear IC.Keywords
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