Optical Properties of As-Antisite andDefects in GaAs
Authors:
- 5 March 1984
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 52 (10) , 851-854
Abstract
This Letter reports the first application of an ESR-tagged magnetic circular dichroism measurement to a paramagnetic deep-level defect in a semiconductor. In semi-insulating GaAs two new absorption bands are found at 1.05 and 1.29 eV. Both bands are identified as intracenter electronic transitions of the As-antisite defect. The analysis of the absorption and concentration data implies that the "dominant electron trap" () in GaAs is not the As antisite.
Keywords
This publication has 15 references indexed in Scilit:
- Intracenter transitions in the dominant deep level (EL2) in GaAsApplied Physics Letters, 1983
- Neutron-transmutation doping of GaAs — as studied by ESRSolid State Communications, 1982
- Deep-center photoluminescence in undoped semi-insulating GaAs: 0.68 eV band due to the main deep donorSolid State Communications, 1982
- Identification of AsGa antisites in plastically deformed GaAsJournal of Applied Physics, 1982
- Electron spin resonance of AsGa antisite defects in fast neutron-irradiated GaAsApplied Physics Letters, 1982
- Optical assessment of the main electron trap in bulk semi-insulating GaAsApplied Physics Letters, 1981
- The observation of high concentrations of arsenic anti-site defects in electron irradiated n-type GaAs by X-band EPRSolid State Communications, 1981
- Submillimeter EPR evidence for the As antisite defect in GaAsSolid State Communications, 1980
- Electron-Spin Memory in the Optical-Pumping Cycle ofCenters in Alkali Halides and Electron-Spin Resonance of the Relaxed Excited StatePhysical Review Letters, 1969
- Effect of Applied Fields on the Optical Properties of Color CentersPhysical Review B, 1965