Chemical sensing materials characterization by Kelvin probe technique

This publication has 15 references indexed in Scilit:

• Flat Lying Pin-Stripe Phase of Decanethiol Self-Assembled Monolayers on Au(111)
  Langmuir, 1998
• Kelvin prove investigation of self-assembled-monolayers of thiol derivatized porphyrins interacting with volatile compounds
  Sensors and Actuators B: Chemical, 1998
• Surface Photovoltage of Porphyrin Layers Using the Kelvin Probe Technique
  The Journal of Physical Chemistry B, 1997
• A Novel Synthetic Route to Sapphyrins
  The Journal of Organic Chemistry, 1997
• Fermi level determination in organic thin films by the Kelvin probe method
  Journal of Applied Physics, 1996
• Molecular solid of zinc tetraphenylporphyrin as a model organic semiconductor with a well-defined depletion layer
  Journal of Physics and Chemistry of Solids, 1995
• Work function measurements for gas detection using tin oxide layers with a thickness between 1 and 200 nm
  Thin Solid Films, 1994
• Contact potential measurement: Spacing-dependence errors
  Review of Scientific Instruments, 1992
• Noise and the Kelvin method
  Review of Scientific Instruments, 1991
• Conductance, work function and catalytic activity of SnO2-based gas sensors
  Sensors and Actuators B: Chemical, 1991