Migration of Metals on Graphite in Scanning Tunneling Microscopy
Authors:
- Masanori OhtoMOMasanori Ohto
- Satoru YamaguchiSYSatoru Yamaguchi
- Keiji TanakaKTKeiji Tanaka
- 1 June 1995
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 34 (6A) , L694
Abstract
Metals such as Au deposited on graphite substrates are found to migrate very easily when biased in scanning tunneling microscopes. Depending upon the film thickness and the tip voltage, a hillock surrounded by grooves or a hole surrounded by hillocks with a height of ∼±10 nm and a lateral dimension of ∼100 nm are formed. The mechanism of these surface-modification phenomena is discussed in light of electro- and thermomigration.Keywords
This publication has 13 references indexed in Scilit:
- Contributions of scanning probe microscopy and spectroscopy to the investigation and fabrication of nanometer-scale structures*Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena, 1994
- Pascualet al. replyPhysical Review Letters, 1994
- Field evaporation between a gold tip and a gold surface in the scanning tunneling microscope configurationPhysical Review Letters, 1994
- Quantum contact in gold nanostructures by scanning tunneling microscopyPhysical Review Letters, 1993
- Effects of an electric field in atomic manipulationsPhysical Review B, 1991
- Electromigration in thin-film interconnection lines: models, methods and resultsMaterials Science Reports, 1991
- Fast nanoscale modification of Ag(111) using a scanning tunneling microscopeApplied Physics Letters, 1991
- Atomic emission from a gold scanning-tunneling-microscope tipPhysical Review Letters, 1990
- Electromigration in metalsReports on Progress in Physics, 1989
- Nanometer scale structure fabrication with the scanning tunneling microscopeApplied Physics Letters, 1987