The IEEE standards on reliability program and reliability prediction methods for electronic equipment
Authors:
- Michael PechtaMichael Pechta
- Diganta DasaDDDiganta Dasa
- Arun RamakrishnanbARArun Ramakrishnanb
- 1 September 2002
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 42 (9-11) , 1259-1266