Optical method for determining the grain resistivity in ZnO-based ceramic varistors

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Abstract
An optical technique for evaluating the grain resistivity in ZnO ceramic varistors is described. It is based on the existence of a rather sharp minimum in the infrared reflectance whose wavelength position depends on the free-electron density and hence on the ZnO grain resistivity. Values of resistivity obtained from optical measurements are in good agreement with those obtained using alternative evaluation techniques.

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