Application of various optical techniques for ESD defect localization
Authors:
- F. EsselyFEF. Essely
- F. DarracqFDF. Darracq
- V. PougetVPV. Pouget
- M. RemmachMRM. Remmach
- F. BeaudoinFBF. Beaudoin
- N. GuitardNGN. Guitard
- M. BafleurMBM. Bafleur
- P. PerduPPP. Perdu
- A. TouboulATA. Touboul
- D. LewisDLD. Lewis
- 1 September 2006
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 46 (9-11) , 1563-1568
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- Light Emission to Time Resolved Emission For IC Debug and Failure AnalysisMicroelectronics Reliability, 2005
- ESD induced latent defects in CMOS ICs and reliability impact2004
- Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localizationMicroelectronics Reliability, 2003
- Time-resolved optical characterization of electrical activity in integrated circuitsProceedings of the IEEE, 2000