Characterization of the microstructure of sintered AIN by transmission electron microscopy

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31 March 1989

journal article
Published by Elsevier in Materials Science and Engineering: A

Vol. 109, 157-160
DOI:10.1016/0921-5093(89)90580-7

Abstract

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This publication has 4 references indexed in Scilit:

Antiphase boundaries in GaAs
Applied Physics Letters, 1985
Aluminum Nitride-An Alternative Ceramic Substrate for High Power Applications in Microcircuits
IEEE Transactions on Components, Hybrids, and Manufacturing Technology, 1984
Role of Y ₂ O ₃ and SiO ₂ Additions in Sintering of AIN
Journal of the American Ceramic Society, 1974
Nonmetallic crystals with high thermal conductivity
Journal of Physics and Chemistry of Solids, 1973