Seeman–Bohlin X-ray diffractometer for thin films
Authors:
- R. FederRFR. Feder
- B. S. BerryBBB. S. Berry
- 1 October 1970
- journal article
- research article
- Published by International Union of Crystallography (IUCr) in Journal of Applied Crystallography
- Vol. 3 (5) , 372-379