Photothermal measurements near a 90° edge. II. Characterization of subsurface rectangular voids and close planar cracks
- 1 July 1993
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 74 (1) , 548-557
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Photothermal determination of vertical crack lengths in silicon nitrideApplied Physics A, 1990
- Characterization of plasma sprayed coatings using thermal wave infrared video imagingJournal of Nondestructive Evaluation, 1987
- Photothermal beam-deflection imaging of vertical interfaces in solidsCanadian Journal of Physics, 1986
- Thermal wave imaging of closed cracks in opaque solidsJournal of Applied Physics, 1983
- Subsurface flaw detection in metals by photoacoustic microscopyaJournal of Applied Physics, 1980