Electron beam induced growth of tin whiskers
- 22 September 2015
- journal article
- conference paper
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 118 (12) , 125301
Abstract
We have investigated the influence of electron irradiation on tin whisker growth. Sputtered tin samples exposed to electron beam of 6 MeV energy exhibited fast whisker growth, while control samples did not grow any whiskers. The statistics of e-beam induced whiskers was found to follow the log-normal distribution. The observed accelerated whisker growth is attributed to electrostatic effects due to charges trapped in an insulating substrate. These results offer promise for establishing whisker-related accelerated life testing protocols.Keywords
Funding Information
- U.S. Nuclear Regulatory Commission (NRC-HQ-12-G-38-0042)
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