Dimma: Semi-Supervised Low-Light Image Enhancement with Adaptive Dimming
Open Access
Abstract
Enhancing low-light images with natural colors poses a challenge due to camera processing variations and limited access to ground-truth lighting conditions. To address this, we propose Dimma, a semi-supervised approach that aligns with any camera using a small set of image pairs captured under extreme lighting conditions. Our method employs a convolutional mixture density network to replicate camera-specific noise present in dark images. We enhance results further by introducing a conditional UNet architecture based on user-provided lightness values. Trained on just a few real image pairs, Dimma achieves competitive results compared to fully supervised state-of-the-art methods trained on large datasets.Keywords
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Funding Information
- National Centre of Science (Poland) (2021/43/B/ST6/02853, PLG/2023/016646)
- Polish high-performance computing infrastructure PLGrid (HPC Centers: ACK Cyfronet AGH, CI TASK) (2021/43/B/ST6/02853, PLG/2023/016646)
This publication has 23 references indexed in Scilit:
- Low-Light Image Enhancement with Wavelet-Based Diffusion ModelsACM Transactions on Graphics, 2023
- AdaPool: Exponential Adaptive Pooling for Information-Retaining DownsamplingIEEE Transactions on Image Processing, 2022
- Low-Light Image and Video Enhancement Using Deep Learning: A SurveyIEEE Transactions on Pattern Analysis and Machine Intelligence, 2021
- EnlightenGAN: Deep Light Enhancement Without Paired SupervisionIEEE Transactions on Image Processing, 2021
- Benchmarking Low-Light Image Enhancement and BeyondInternational Journal of Computer Vision, 2021
- Beyond Brightening Low-light ImagesInternational Journal of Computer Vision, 2021
- Learning a Deep Single Image Contrast Enhancer from Multi-Exposure ImagesIEEE Transactions on Image Processing, 2018
- Microsoft COCO: Common Objects in Context2014
- Making a “Completely Blind” Image Quality AnalyzerIEEE Signal Processing Letters, 2012
- Image quality assessment: from error visibility to structural similarityIEEE Transactions on Image Processing, 2004