Model forFlux Noise in SQUIDs and Qubits
- 27 June 2007
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 98 (26) , 267003
Abstract
We propose a model for flux noise in superconducting devices ( is frequency). The noise is generated by the magnetic moments of electrons in defect states which they occupy for a wide distribution of times before escaping. A trapped electron occupies one of the two Kramers-degenerate ground states, between which the transition rate is negligible at low temperature. As a result, the magnetic moment orientation is locked. Simulations of the noise produced by randomly oriented defects with a density of yield noise magnitudes in good agreement with experiments.
Keywords
All Related Versions
This publication has 19 references indexed in Scilit:
- Decoherence of Flux Qubits due toFlux NoisePhysical Review Letters, 2006
- Decoherence of a superconducting qubit due to bias noisePhysical Review B, 2003
- Reduction of 1/f noise in high-T c dc superconducting quantum interference devices cooled in an ambient magnetic fieldApplied Physics Letters, 1996
- Direct lifetime measurements and interactions of charged defect states in submicron Josephson junctionsPhysical Review Letters, 1987
- Low-frequency noise in dc superconducting quantum interference devices below 1 KApplied Physics Letters, 1987
- Defect structure of glassesJournal of Non-Crystalline Solids, 1985
- Composition ofNoise in Metal-Insulator-Metal Tunnel JunctionsPhysical Review Letters, 1984
- Flicker (1/f) noise in tunnel junction dc SQUIDSJournal of Low Temperature Physics, 1983
- Low-frequency fluctuations in solids:noiseReviews of Modern Physics, 1981
- Noise in Semiconductors: Spectrum of a Two-Parameter Random SignalJournal of Applied Physics, 1954