High-speed non-contact profiler based on scanning white light interferometry
Authors:
- L. DeckLDL. Deck
- P. de GrootPGP. de Groot
- 1 February 1995
- journal article
- Published by Elsevier in International Journal of Machine Tools and Manufacture
- Vol. 35 (2) , 147-150
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
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