A method for indexing field ion micrographs
Authors:
- R W NewmanRNR W Newman
- R C SanwaldRSR C Sanwald
- J J HrenJHJ J Hren
- 1 October 1967
- journal article
- Published by IOP Publishing in Journal of Scientific Instruments
- Vol. 44 (10) , 828-830
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- The accurate determination of crystal orientation from field ion micrographsJournal of Scientific Instruments, 1964
- Field Ionization and Field Ion Microscopy1960
- Die Bestimmung der Polarisierbarkeit von Atomen und Molekülen mit dem FeldelektronenmikroskopThe European Physical Journal A, 1952