Electronic and optical studies of pulse laser deposited ZnO/NiO bilayer film
Authors:
Open Access
- 1 October 2016
- conference paper
- Published by IOP Publishing in Journal of Physics: Conference Series
- Vol. 755 (1) , 012036
Abstract
We report the structural, optical and electronic properties of polycrystalline ZnO and NiO thin films and amorphous ZnO/NiO bilayer film, prepared by pulsed laser deposition technique. Despite of the presence of both Zn and Ni in +2 state in the bilayer film, the grown bilayer shows no reflections (in XRD) corresponding to ZnO or NiO. The difference in crystal structure of ZnO and NiO leads to the strain in the grown bilayer film. An increase in the band gap has been observed in bilayer film which can be attributed to the amorphous nature of the structure.Keywords
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