Strategic engineering of CoS2/ZnIn2S4 heterostructures incorporating Ar plasma-induced sulfur vacancies for potentiating electrocatalytic activity in furazolidone determination
- 14 April 2025
- journal article
- research article
- Published by Royal Society of Chemistry (RSC) in The Analyst
- Vol. 150 (10) , 2137-2145
Abstract
Strategic engineering of CoS2/ZnIn2S4 heterostructures incorporating Ar plasma-induced sulfur vacancies for boosted electrocatalytic activity in furazolidone detection.Keywords
Funding Information
- National Natural Science Foundation of China (22304086)
- National Natural Science Foundation of China (22276100)
- Natural Science Foundation of Jiangsu Province (BK20220405)
This publication has 44 references indexed in Scilit:
- Modulation of Sulfur Vacancies in ZnIn2S4/MXene Schottky Heterojunction Photocatalyst Promotes Hydrogen EvolutionAdvanced Functional Materials, 2024
- Vacancy Engineering in 2D Transition Metal Chalcogenide Photocatalyst: Structure Modulation, Function and Synergy ApplicationSmall, 2024
- Advances of Electrochemical and Electrochemiluminescent Sensors Based on Covalent Organic FrameworksNano-Micro Letters, 2023
- Crystallization‐Induced Enhanced Electrochemiluminescence from a New Tris(bipyridine)ruthenium(II) DerivativeAdvanced Functional Materials, 2023
- Specific sensing of antibiotics with metal-organic frameworks based dual sensor systemNano Research, 2022
- Plasma‐Triggered Synergy of Exfoliation, Phase Transformation, and Surface Engineering in Cobalt Diselenide for Enhanced Water OxidationAngewandte Chemie International Edition, 2018
- Plasma‐Engraved Co3O4 Nanosheets with Oxygen Vacancies and High Surface Area for the Oxygen Evolution ReactionAngewandte Chemie International Edition, 2016
- Screening method for the detection of a range of nitrofurans in avian eyes by optical biosensorAnalytica Chimica Acta, 2011
- Electrochemical sensors based on metal and semiconductor nanoparticlesMicrochimica Acta, 2009
- Electroanalytical and Bioelectroanalytical Systems Based on Metal and Semiconductor NanoparticlesElectroanalysis, 2004