Dielectric properties of Sn2P2S6 crystals as a function of their growth conditions

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Abstract
The behavior of the permittivity near a phase transition in Sn2P2S6 crystals of different technological quality is studied. It is established that, in high-resistance crystals, where an internal electric field is formed by the screening of spontaneous polarization in the polar phase, long-time relaxation of ɛ is observed in a temperature range ∼2 K above T max. This relaxation and change in the form of the maximum of ɛ′(T) at a phase transition are attributed to an internal electric field induced by the volume space charge formed in regions near the surface. It is established that the existing differences in the properties of Sn2P2S6 crystals are due to deviations from stoichiometry, arising during growth and synthesis of the crystals.