The influence of Mg doping on the formation of Ga vacancies and negative ions in GaN bulk crystals
- 18 October 1999
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 75 (16) , 2441-2443
Abstract
Gallium vacancies and negative ions are observed in GaN bulk crystals by applying positron lifetime spectroscopy. The concentration of Ga vacancies decreases with increasing Mg doping, as expected from the behavior of the VGa formation energy as a function of the Fermi level. The concentration of negative ions correlates with that of Mg impurities determined by secondary ion mass spectrometry. We thus attribute the negative ions to MgGa−. The negative charge of Mg suggests that Mg doping converts n-type GaN to semi-insulating mainly due to the electrical compensation of ON+ donors by MgGa− acceptors.Keywords
This publication has 8 references indexed in Scilit:
- Molecular doping of gallium nitrideApplied Physics Letters, 1999
- Gallium vacancies and the growth stoichiometry of GaN studied by positron annihilation spectroscopyApplied Physics Letters, 1998
- Observation of Native Ga Vacancies in GaN by Positron AnnihilationPhysical Review Letters, 1997
- Pressure Induced Deep Gap State of Oxygen in GaNPhysical Review Letters, 1997
- Point-defect complexes and broadband luminescence in GaN and AlNPhysical Review B, 1997
- Gallium vacancies and the yellow luminescence in GaNApplied Physics Letters, 1996
- Investigation of Vacancies in GaN by Positron AnnihilationMRS Proceedings, 1996
- Theory of positrons in solids and on solid surfacesReviews of Modern Physics, 1994