Evaluation of Signature-Based Testing of RF/Analog Circuits
Authors:
- 7 June 2005
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 62-67
Abstract
Due to its low cost, low test time and reduced test complexity, structural testing is preferred to functional whenever possible. The study presented in this paper indicates that the two low-frequency structural test methods considered, power supply current monitoring and the power supply ramping technique, provide a valuable supplement/alternative when one of the functional tests (gain, noise figure and total harmonic distortion) in the test set can be complemented or substituted by structural test and add to or maintain no loss of fault coverage.Keywords
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