Use of rutherford scattering on a secondary carbon target for correcting intermediate thickness sample PIXE measurements
Authors:
- P. AloupogiannisPAP. Aloupogiannis
- G. RobayeGRG. Robaye
- I. RoelandtsIRI. Roelandts
- G. WeberGWG. Weber
- J.M. Delbrouck-HabaruJDJ.M. Delbrouck-Habaru
- J.P. QuisefitJQJ.P. Quisefit
- 1 March 1986
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 14 (3) , 297-303
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- PIXE analysis of aerosol samples collected over the atlantic ocean from a sailboatNuclear Instruments and Methods, 1981
- PIXE analysis of samples of intermediate thicknessNuclear Instruments and Methods, 1981
- PIXE calibration and absorption corrections with the aid of proton scatteringNuclear Instruments and Methods, 1981
- Quantitative analysis of complex targets by proton-induced x raysJournal of Applied Physics, 1975