Growth parameters effect on the thermoelectric characteristics of Bi2Se3 thin films grown by MOCVD system using Ditertiarybutylselenide as a precursor
Authors:
- 31 October 2003
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 258 (1-2) , 135-140
Abstract
No abstract availableKeywords
This publication has 16 references indexed in Scilit:
- Preparation and characterization of Bi2Se3 thin films deposited by successive ionic layer adsorption and reaction (SILAR) methodMaterials Chemistry and Physics, 2000
- Growth of Bi2Te3 and Sb2Te3 thin films by MOCVDMaterials Science and Engineering: B, 1999
- Effect of antimony concentration on the electrical and thermoelectrical properties of (Bi1−xSbx)2Te3 thin films grown by metal organic chemical vapour deposition (MOCVD) techniqueJournal of Crystal Growth, 1999
- Synthesis and characterization of nanocrystalline Bi2Se3 by solvothermal methodMaterials Research Bulletin, 1999
- Preparation and characterization of MOCVD bismuth telluride thin filmsJournal of Crystal Growth, 1998
- Electronic structure and thermoelectric properties of bismuth telluride and bismuth selenideJournal of Physics: Condensed Matter, 1997
- Electrical properties of bismuth selenide (Bi2Se3) thin films prepared by reactive evaporationSolid State Communications, 1993
- Narrow-bandgap semiconductor-based thermal sensorsSensors and Actuators A: Physical, 1991
- Bi2Se3 Hall Effect Magnetometer for Reliable Low Temperature UseReview of Scientific Instruments, 1973
- New Semiconducting CompoundsPhysical Review B, 1956