Statistical modeling and reliability prediction for transient luminance degradation of flexible OLEDs
Authors:
- 1 March 2018
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 3C.7-1
Abstract
An important technical challenge associated with using OLEDs is to develop an appropriate statistical modeling and reliability assessment for precise lifetime prediction. We, herein, propose a modified stretched exponential decay (MSED) model for luminescence decay with respect to intrinsic emissive layer, which is dependent initial luminescence behaviors and subsequent degradation in the constant current stress tests. By using the model well fitted to experimental data from accelerated stress tests, we successfully demonstrate that a MSED extracted from statistical modeling enables precise lifetime prediction with respect to process variation and duty factor in real operation conditions.Keywords
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