Capacitance-voltage measurements on metal-SiO/sub 2/-diamond structures fabricated with
Authors:
- J.A. GregoryJGJ.A. Gregory
- B.B. PateBPB.B. Pate
- 1 March 1991
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 38 (3) , 619-626
Abstract
No abstract availableKeywords
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