Construction of efficiency curves for semiconductor X-ray spectrometers

Authors:

JCJ.L. Campbell
J.L. Campbell
LML.A. McNelles
L.A. McNelles

Publisher website

1 February 1972

journal article
Published by Elsevier in Nuclear Instruments and Methods

Vol. 98 (3) , 433-444
DOI:10.1016/0029-554x(72)90225-x

Abstract

No abstract available

Keywords

This publication has 14 references indexed in Scilit:

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