Reliability-Aware VPR-Aided Integrated Localization via Evidence Gating and NIS-Based Adaptive Covariance Scaling
- 1 January 2026
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Automation Science and Engineering
- Vol. 23, 18728-18742
Abstract
No abstract availableFunding Information
- National Natural Science Foundation of China (T2422002)
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