The influence of heat treatment on the optical properties of titanium oxide thin films
Authors:
- Diana MardareDMDiana Mardare
- 1 October 2002
- journal article
- research article
- Published by Elsevier in Materials Letters
- Vol. 56 (3) , 210-214
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
- On the optical constants of TiO2 thin films. Ellipsometric studiesMaterials Research Bulletin, 2000
- Structural and electrical properties of TiO2 RF sputtered thin filmsMaterials Science and Engineering: B, 2000
- On the structural properties and optical transmittance of TiO2 r.f. sputtered thin filmsApplied Surface Science, 2000
- Optical dispersion analysis of TiO2 thin films based on variable-angle spectroscopic ellipsometry measurementsMaterials Science and Engineering: B, 1999
- Characterization of sputter-deposited chromium oxide thin filmsSurface and Coatings Technology, 1999
- Microstructure modification of amorphous titanium oxide thin films during annealing treatmentThin Solid Films, 1997
- Investigations of titanium oxide films deposited by d.c. reactive magnetron sputtering in different sputtering pressuresThin Solid Films, 1993
- The effect of substrate temperature on the properties of d.c. reactive magnetron sputtered titanium oxide filmsThin Solid Films, 1993
- dc reactive magnetron sputtering of titanium-structural and optical characterization of TiO2 filmsJournal of Applied Physics, 1992
- Quantitative Analysis of Anatase-Rutile Mixtures with an X-Ray DiffractometerAnalytical Chemistry, 1957