Benefits of High‐Resolution Electron Microscopy for the Structural Characterization of Mullites
- 1 October 1991
- journal article
- Published by Wiley in Journal of the American Ceramic Society
- Vol. 74 (10) , 2359-2366
Abstract
The structure of 3:2 mullites is investigated by high‐resolution electron microscopy. Attention is paid to the identification of isolated defects, i.e., oxygen vacancies in pure 3:2 mullite and chromium interstitials in chromium‐doped mullite. Models for such defects, including lattice reconstruction effects, are analyzed with the help of image simulations.Keywords
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