Assessment of yield loss of wheat caused by spot blotch using regression model
Authors:
- 2 June 2018
- journal article
- research article
- Published by Springer Nature in Indian Phytopathology
- Vol. 71 (2) , 291-294
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- Selection Index for Improving Helminthosporium Leaf Blight Resistance, Maturity, and Kernel Weight in Spring WheatCrop Science, 2003
- Use Of a Simulation Model to Explore Fungicide Strategies for Control of Cercospora Leafspot of Peanut1Peanut Science, 1988
- Evaluation of wheat cultivars for ability to retard development of stem rustAnnals of Applied Biology, 1975