Cross sectional studies of buried semiconductor interfaces by means of photoemission microscopy
Authors:
- 8 April 2002
- journal article
- conference paper
- Published by AIP Publishing in Applied Physics Letters
- Vol. 80 (14) , 2511-2513
Abstract
An important application of photoemission spectromicroscopy would be to measure heterostructures and semiconductor devices in cross section to directly determine band offsets and band bending. We present here studies of p-n GaAs homojunctions and Al/GaAs Schottky junctions fabricated by molecular-beam epitaxy. Our results suggest that a minimum experimental uncertainty of about 0.15 eV will effect band offset determination. In general, useful quantitative information on the junction electrostatics can be obtained provided that the experimental data are analyzed to substract the diffuse photon background and take into account the intensity profile of the photon spot.Keywords
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