ParameterNet: Parameters are All You Need for Large-Scale Visual Pretraining of Mobile Networks
Authors:
Top Cited Papers
- 16 June 2024
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 15751-15761
Abstract
The large-scale visual pretraining has significantly improve the performance of large vision models. However, we observe the low FLOPs pitfall that the existing low-FLOPs models cannot benefit from large-scale pretraining. In this paper, we introduce a novel design principle, termed ParameterNet, aimed at augmenting the number of parameters in large-scale visual pretraining models while minimizing the increase in FLOPs. We leverage dynamic convolutions to incorporate additional parameters into the networks with only a marginal rise in FLOPs. The ParameterNet approach allows low-FLOPs networks to take advantage of large-scale visual pretraining. Furthermore, we extend the ParameterNet concept to the language domain to enhance inference results while preserving inference speed. Experiments on the large-scale ImageNet-22K have shown the superiority of our ParameterNet scheme. For example, ParameterNet-600M can achieve higher accuracy than the widely-used Swin Transformer (81.6% vs. 80.9%) and has much lower FLOPs (0.6G vs. 4.5G). The code will be released at https://parameternet.github.io/.Keywords
All Related Versions
This publication has 34 references indexed in Scilit:
- End-to-End Object Detection with Transformers2020
- Big Transfer (BiT): General Visual Representation Learning2020
- The Open Images Dataset V4International Journal of Computer Vision, 2020
- Deep Networks with Stochastic Depth2016
- Deep Residual Learning for Image Recognition2016
- Rethinking the Inception Architecture for Computer Vision2016
- Fully convolutional networks for semantic segmentation2015
- ImageNet Large Scale Visual Recognition ChallengeInternational Journal of Computer Vision, 2015
- Empirical Risk Minimization2011
- Gradient-based learning applied to document recognitionProceedings of the IEEE, 1998