Techniques for minimizing space proton damage in scientific charge coupled devices
Authors:
- A. HollandAHA. Holland
- A. Holmes-SiedleAHA. Holmes-Siedle
- B. JohlanderBJB. Johlander
- L. AdamsLAL. Adams
- 1 December 1991
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 38 (6) , 1663-1670
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
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- Energy Dependence of Proton-Induced Displacement Damage in SiliconIEEE Transactions on Nuclear Science, 1986
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