Ultrawideband characterisation of photoimageable thick film materials for microwave and millimeter-wave design
Authors:
- D. StephensDSD. Stephens
- I.D. RobertsonIRI.D. Robertson
- 1 January 2005
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 2159-2162
Abstract
This paper describes the accurate characterization of a photoimageable thick film dielectric with 1 to 110 GHz measurements on a two port microstrip ring resonator. The loss tangent is found to remain below 0.006 up to over 110 GHz. The line losses are found to be better than many reported results for thin film technology, with less than 0.2dB/mm at 80 GHz. Using the data, a 64 GHz bandpass filter and a lumped element 3 GHz low pass filter are designed and measured.Keywords
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